Integrating Harris Corner Detector and SIFT Descriptor for High-Accuracy Feature Matching in Image Processing

Authors

  • Ali Salam Al-jaberi College of Computer Sciences and Information Technology, University of Al-Qadisiyah, Al-Qadisiyah, Iraq
  • Sura Fadhil Rahman Computer Techniques Engineering, Imam AL-Kadhum College, Al-Qadisiyah, Iraq.
  • Ihsan Faisal Raheem Nizam College, Osmania University , Al-Qadisiyah , Iraq.

DOI:

https://doi.org/10.29304/jqcsm.2025.17.32455

Keywords:

Harris Corner, SIFT Descriptor

Abstract

Feature matching is one of the primary operations in image processing and computer vision. In this work, the limitations of the Harris corner detector—sensitivity to scale and noise—are highlighted and its performance enhanced through the integration of the SIFT descriptor that is invariant to rotation and scale. The aim is to make feature matching more accurate and robust under varied conditions. The approach that was suggested was implemented on the Ishtar Gate, the Egyptian Pyramids, and the Save Iraqi Culture Monument photos. The process involved keypoint detection with Harris, description with SIFT, and feature matching using the nearest neighbor distance ratio. Precise and accurate results were obtained, particularly with structured images like the Ishtar Gate (100% precision, 99% accuracy). The joint approach is strong in overcoming conventional detector limitations and improving reliability in image matching. There is potential for further research in extending the model to medical imaging and real-time applications.

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References

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Published

2025-09-30

How to Cite

Salam Al-jaberi, A., Rahman, S. F., & Raheem, I. F. (2025). Integrating Harris Corner Detector and SIFT Descriptor for High-Accuracy Feature Matching in Image Processing. Journal of Al-Qadisiyah for Computer Science and Mathematics, 17(3), Comp 179–190. https://doi.org/10.29304/jqcsm.2025.17.32455

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Section

Computer Articles

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